12″ P-type <100> CZ silicon
775 ± 25 µm · >=0.5 Ω·cm · Epi · stock ID 12-52
- Stock ID
- 12-52
- Diameter
- 12″ (300 mm)
- Growth method
- Czochralski (CZ)
- Type
- P-type
- Orientation
- <100>
- Thickness
- 775 ± 25 µm
- Resistivity
- >=0.5 Ω·cm
- Flat / notch
- Notch
- Front side
- Epi
- Back side / grade
- Excess
- Source
- Siltronic
Compare cz silicon wafers in stock, or use our wafer specification guide to read thickness, doping and finish values.
Listed in the silicon stock wafers. Values are as recorded for the lot; ask us for measured data.